Materials and Characterization Laboratories

florence.paray [at] mcgill.ca (Dr. Florence Paray) (514) 398-3590

  • Sample preparation
  • Light Optical Microscopy
  • Stereomicroscopy
  • Quantitative metallography
  • Image analysis

robert.paquette [at] mcgill.ca (Robert Paquette, Technician) (514) 398-5587

  • Heat treatment.
  • Hardness testing (Vickers, Knoop, Rockwell, Brinell, Microhardness).
  • Mechanical testing (Charpy, tensile, three points, four points bending, etc.).

X-Ray Diffractometers

Philips PW 1710 Powder X-Ray Diffractometer

  • Identification of constituents and crystalline structure of minerals, corrosion products and inorganic materials.
  • Qualitative and semi-quantitative analysis of crystalline phases in a sample.

monique.riendeau [at] mcgill.ca (Monique Riendeau, Technician) (514) 398-2610


Bruker D8 Discovery X-Ray Diffractometer

  • High-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, bio-materials and semiconductors.
  • Use of radiation from a Co-tube for texture and residual stress investigations.
  • Typical XRD diffraction analyses.

florence.paray [at] mcgill.ca (Dr Florence Paray )(514) 398 3590