ECSE 649 VLSI Testing (4 credits)

Note: This is the 2016–2017 edition of the eCalendar. Update the year in your browser's URL bar for the most recent version of this page, or click here to jump to the newest eCalendar.

Offered by: Electrical & Computer Engr (Faculty of Engineering)

Administered by: Graduate Studies


Electrical Engineering : The course is to orient designers of VLSI chips and boards to think about testing problems in parallel with the design process. Consideration in structured design-for-testability as a requirement for complex systems will be emphasized; as well as the emerging concept of built-in self-test (BIST).

Terms: This course is not scheduled for the 2016-2017 academic year.

Instructors: There are no professors associated with this course for the 2016-2017 academic year.

  • (3-0-9)

  • Prerequisite: B.Eng. or equivalent.