ECSE 649 VLSI Testing (4 credits)

Offered by: Electrical & Computer Engr (Faculty of Engineering)

Administered by: Graduate Studies


Electrical Engineering : The course is to orient designers of VLSI chips and boards to think about testing problems in parallel with the design process. Consideration in structured design-for-testability as a requirement for complex systems will be emphasized; as well as the emerging concept of built-in self-test (BIST).

Terms: This course is not scheduled for the 2019-2020 academic year.

Instructors: There are no professors associated with this course for the 2019-2020 academic year.

  • (3-0-9)

  • Prerequisite: B.Eng. or equivalent.