Updated: Fri, 10/11/2024 - 12:00

Campus/building access, classes and work will return to usual conditions, as of Saturday, Oct. 12. See Campus Public Safety website for details.

Accès au campus et aux immeubles, cours et modalités de travail : retour à la normale à compter du samedi 12 octobre. Complément d’information : Direction de la protection et de la prévention.

McGill.CA / McGill Chemistry Characterization Facility / Instrumentation / Microscopy and imaging

CYPHER-S Scanning Probe Microscope (Asylum Research)

Contact: milab.chemistry [at] mcgill.ca (Mohini Ramkaran) - Location: PP202

Faces scheduling system group: MU_CHEM_AFM

Documentation - Training - Rates

Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force) and magnetic.

Features

  • Maximum Lateral (X-Y) scan range 30 x 30 μm, Vertical (Z) range 5 μm, Closed-loop control
  • Maximum sample size: 15 mm diameter, 7 mm thick
  • Noise level: < 0.05 nm (Z height)
  • Operation modes:
  • Contact Mode
  • AC Mode (Tapping Mode)
  • Phase Imaging
  • Dual AC (bimodal AFM)
  • Force Mode (Contact Mode and AC mode)
  • Lateral Force Mode (LFM)
  • Piezoresponse Force Microscopy (PFM)
  • Magnetic Force Microscopy (MFM)
  • Conductive AFM (cAFM)
  • Scanning Tunneling Microscopy (STM)

 

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