MFP-3D Stand Alone AFM (Asylum Research)
Contact: milab.chemistry [at] mcgill.ca (Mohini Ramkaran) - Location: OM21A
Faces scheduling system group: MU_CHEM_AFM
Documentation - Training - Rates
Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation), electrical (conducting AFM, piezo force).
Features
- Maximum Lateral (X-Y) scan range 90 x 90 μm, Vertical (Z) range 40 μm, Closed-loop control
- Maximum sample size: 86 mm x 38 mm, 5mm thick
- Noise level: < 0.06 nm (Z height)
- Operation modes:
- Contact Mode
- AC Mode (Tapping Mode)
- Phase Imaging
- Force Mode (Contact Mode and AC mode)
- Lateral Force Mode (LFM)
- Environmental control:
- iDrive Fluid imaging
- Closed fluid cell (allows for fluid exchange)
- Bioheater (ambient to 80 °C)
- Humidity sensing cell