Updated: Fri, 10/11/2024 - 12:00

Campus/building access, classes and work will return to usual conditions, as of Saturday, Oct. 12. See Campus Public Safety website for details.

Accès au campus et aux immeubles, cours et modalités de travail : retour à la normale à compter du samedi 12 octobre. Complément d’information : Direction de la protection et de la prévention.

McGill.CA / McGill Chemistry Characterization Facility / Instrumentation / Microscopy and imaging

Nanoscope Multimode Scanning Probe Microscope (Veeco)

Contact: milab.chemistry [at] mcgill.ca (Mohini Ramkaran) - Location: OM21A

Faces scheduling system group: MU_CHEM_AFM

Documentation - Training - Rates

Scanning Probe Microscopy (SPM) allows for visualisation and measurements based on 3D data and probe-sample interactions of surface structures. Methods, in addition to imaging include but not limited to: mechanical characterization (lateral force, force modulation) and magnetic.

Features

  • Maximum Lateral (X-Y) scan range 100 x 100 μm, Vertical (Z) range 5.0 μm
  • Maximum sample size: 15 mm diameter, 5 mm thick
  • Noise level: < 0.03 nm (Z height)
  • Operation modes:
  • Contact Mode AFM
  • Tapping Mode AFM
  • Phase Imaging
  • Non-contact AFM
  • Magnetic Force Microscopy (MFM)
  • Lateral Force Microscopy (LFM)
  • Scanning Tunneling Microscopy (STM)
  • Environmental control: ability to work in fluid
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